Lattice-resolution contrast from a focused coherent electron probe. Part II

Ultramicroscopy

Volumn 96, Issue 1, 2003, Pages 65-81

  Findlay, S D ^a   Allen, L J ^a   Oxley, M P ^a   Rossouw, C J ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b NONE

Author keywords

Coherent contrast; Coherent electron probe; Frozen phonon model; Incoherent contrast; Lattice resolution contrast; Scanning transmission electron microscopy

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SIMULATION; CRYSTAL LATTICES; PHONONS; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

LATTICE-RESOLUTION CONTRAST;

ELECTRON SCATTERING;

ARTICLE; CALCULATION; CRYSTAL; ELECTRON PROBE MICROANALYSIS; OPTICAL RESOLUTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THEORETICAL MODEL;

EID: 0037410905     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00381-9     Document Type: Article

References (36)

1. L.J. Allen, S.D. Findlay, M.P. Oxley, C.J. Rossouw, preceding article in this issue, Ultramicroscopy 96 (2003).
2. Loane R.F., Kirkland E.J., Silcox J. Acta Crystallogr. A. 44:1988;912-927.
3. Anderson S.C., Birkeland C.R., Anstis G.R., Cockayne D.J.H. Ultramicroscopy. 69:1997;83-103.
4. Hillyard S., Loane R.F., Silcox J. Ultramicroscopy. 49:1993;14-25.
5. Pennycook S.J., Jesson D.K. Ultramicroscopy. 37:1990;14-38.
6. Nellist P.D., Pennycook S.J. Ultramicroscopy. 78:1999;111-124.
7. Nellist P.D., Pennycook S.J. Adv. Imaging Electron Phys. 113:2000;147-203.
8. Yamazaki T., Watanabe K., Recnik A., Ceh M., Kawasaki M., Shiojiri M. J. Electron Microsc. 49:2000;753-759.
9. Yamazaki T., Watanabe K., Kikuchi Y., Kawasaki M., Hashimoto I., Shiojiri M. Phys. Rev. B. 61:2000;13833-13839.
10. Watanabe K., Yamazaki T., Kikuchi Y., Kotaka Y., Kawasaki M., Hashimoto I., Shiojiri M. Phys. Rev. B. 63:2000;085316. (5 pp.).
11. P. Rez, private communication, 2001.
12. Allen L.J., Josefsson T.W. Phys. Rev. B. 53:1996;11285-11287.
13. Loane R.F., Peirong X., Silcox J. Acta Crystallogr. A. 47:1991;267-278.
14. Loane R.F., Peirong X., Silcox J. Ultramicroscopy. 40:1992;121-138.
15. Humphreys C.J. Rep. Prog. Phys. 42:1979;1825-1887.
16. Allen L.J., Josefsson T.W., Leeb H. Acta Crystallogr. A. 54:1998;388-398.
17. Allen L.J., Faulkner H.M.L., Leeb H. Acta. Crystallogr. A. 56:2000;119-126.
18. Amali A., Rez P. Microsc. Microanal. 3:1997;28-46.
19. Watanabe K., Yamazaki T., Hashimoto I., Shiojiri M. Phys. Rev. B. 64:2001;115432. (5 pp.).
20. P.G. Self, O'Keefe, in: P.R. Buseck, J.M. Cowley, L. Eyring (Eds.), High-Resolution Transmission Electron Microscopy, Oxford University Press, Oxford, 1988, pp. 244-307.
21. G. Kästner, Many Beam Electron Diffraction Related to Electron Microscope Diffraction Contrast Akademie Verlag, Berlin, 1993, pp. 9-19.
22. Cowley J.M. Appl. Phys. Lett. 15:1969;58-59.
23. Z.L. Wang, Elastic and Inelastic Scattering in Electron Diffraction and Imaging, Plenum Press, New York, London, 1995, pp. 241-246.
24. E.J. Kirkland, Advanced Computing in Electron Microscopy, Plenum Press, New York, London, 1998, pp. 14-16.
25. Pogany A.P., Turner P.S. Acta Crystallogr. A. 24:1968;103-109.
26. W.H. Press, S.A. Teukolsky, W.T. Vetterling, B.P. Flannery, Numerical Recipes in FORTRAN, 2nd Edition, Cambridge University Press, Cambridge, 1992, pp. 449-489.
27. Spence J.C.H., Cowley J.M. Optik. 50:1978;129-142.
28. Ishizuka K. J. Electron Microsc. 50:2001;291-305.
29. Ishizuka K. Ultramicroscopy. 90:2002;71-83.
30. Allen L.J., Rossouw C.J. Phys. Rev. B. 39:1989;8313-8321.
31. Rossouw C.J. Ultramicroscopy. 58:1995;211-222.
32. Allen L.J., Josefsson T.W. Phys. Rev. B. 52:1995;3184-3198.
33. Rossouw C.J., Forwood C.T., Gibson M.A., Miller P.R. Micron. 28:1997;125-137.
34. Fields P.M., Cowley J.M. Acta Crystallogr. A. 34:1978;103-112.
35. Cowley J.M., Fields P.M. Acta Crystallogr. A. 35:1979;28-37.
36. Spence J.C.H. Mater. Sci. Eng. 26:1999;1-49.