Z-contrast imaging in an aberration-corrected scanning transmission electron microscope

Microscopy and Microanalysis

Volumn 6, Issue 4, 2000, Pages 343-352

  Pennycook, S J ^a   Rafferty, B ^a,b   Nellist, P D ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

Aberration correction; Bloch states; Channeling; High angle annular dark field; Scanning transmission electron microscopy; Z contrast

Indexed keywords

EID: 0040185881     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927602000594     Document Type: Article

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