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Volumn 113, Issue 31, 2009, Pages 13558-13564

X-ray photoelectron spectroscopy: A powerful tool for electronic and structural investigations of covalently assembled monolayers. a representative case study

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL CHARACTERIZATION; DIRHODIUM COMPLEX; FORMAMIDINATE; FUNCTIONALIZED; MOLECULAR MONOLAYER; MORPHOLOGICAL CHARACTERIZATION; P-TOLYL; REPRESENTATIVE CASE; SI(1 0 0); SILICA SUBSTRATE; STRUCTURAL INVESTIGATION; X-RAY PHOTOELECTRONS;

EID: 68749084841     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp9027436     Document Type: Article
Times cited : (16)

References (162)
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    • 2nd ed, Briggs, D, Seah, M. P, Eds, Wiley-VCH: Weinheim, Germany
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    • (1995) PracticalSurfacesAnalysis , vol.1
    • Briggs, D.1
  • 112
    • 33748598975 scopus 로고    scopus 로고
    • Gulino, A.; Parker, Jones, F. H.; Egdell, R. G. J. Chem. Soc. Faraday Trans. 1996, 92, 2137.
    • (e) Gulino, A.; Parker, Jones, F. H.; Egdell, R. G. J. Chem. Soc. Faraday Trans. 1996, 92, 2137.
  • 141
    • 0002450903 scopus 로고    scopus 로고
    • Introduction tothe Rietveldmethod
    • Young, R. A, Ed, OxfordUniversity Press: Oxford, England
    • Young, R. A. Introduction tothe Rietveldmethod. In The Rietveld Method; Young, R. A., Ed.; OxfordUniversity Press: Oxford, England, 2002; p 22.
    • (2002) The Rietveld Method , pp. 22
    • Young, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.