Monolayer damage in XPS measurements as evaluated by independent methods

Langmuir

Volumn 13, Issue 19, 1997, Pages 5089-5106

  Frydman, Eli ^a   Cohen, Hagai ^a   Maoz, Rivka ^a   Sagiv, Jacob ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; CARBOXYLIC ACIDS; CONTACT ANGLE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PARAFFINS; RADIATION DAMAGE; SILANES; SUBSTRATES; SURFACE STRUCTURE; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTRALAYER COUPLING;

MONOLAYERS;

EID: 0031233143     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la962058q     Document Type: Article

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60. 7
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