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Volumn 137, Issue 1-3, 1999, Pages 179-183
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A study of HMDSO/O 2 plasma deposits using a high-sensitivity and -energy resolution XPS instrument: Curve fitting of the Si 2p core level
a,c a a d b
d
NONE
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Author keywords
Curve fitting; HMDSO; Plasma; XPS
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Indexed keywords
BINDING ENERGY;
CHEMICAL BONDS;
CURVE FITTING;
MICROWAVES;
OXYGEN;
PLASMA SPRAYING;
SILICON COMPOUNDS;
X RAY PHOTOELECTRON SPECTROSCOPY;
HEXAMETHYLDISILOXANE;
PLASMA DEPOSITED COATINGS;
SPRAYED COATINGS;
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EID: 0032761517
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(98)00479-6 Document Type: Article |
Times cited : (315)
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References (7)
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