Relationship between defect density and charge carrier transport in amorphous and microcrystalline silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 10, 2009, Pages

  Astakhov, Oleksandr ^a,b   Carius, Reinhard ^a   Finger, Friedhelm ^a   Petrusenko, Yuri ^b   Borysenko, Valery ^b   Barankov, Dmytro ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b KHARKOV INSTITUTE OF PHYSICS AND TECHNOLOGY   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 64149085462     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.104205     Document Type: Article

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