Study of metastabilities in microcrystalline silicon films by photoconductivity techniques

Thin Solid Films

Volumn 501, Issue 1-2, 2006, Pages 129-132

  Souffi, N ^a   Bauer, G H ^a   Bruggemann R ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

Adsorption; Photoconductivity; Silicon

Indexed keywords

ADSORPTION; AMORPHOUS MATERIALS; CRYSTALLINE MATERIALS; DEPOSITION; DIFFRACTION GRATINGS; PHOTOCONDUCTIVITY; PHOTOCURRENTS; SILICON;

MICROCRYSTALLINE SILICON SAMPLES; VALENCE BAND;

WIRE;

EID: 32644468176     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.07.139     Document Type: Conference Paper

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