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Journal of Non-Crystalline Solids

Volumn 227-230, Issue PART 2, 1998, Pages 1021-1025

ESR and transport in microcrystalline silicon

(5) Lips, K a Kanschat, P a Will, D b Lerner, C b Fuhs, W a

a HAHN MEITNER INSTITUT (Germany)

b PHILIPPS UNIVERSITY MARBURG (Germany)

Author keywords

Conductivity; Dark current; Density; Electron spin resonance; Microcrystalline silicon

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC CURRENTS; ELECTRON TRANSPORT PROPERTIES; MAGNETIC RESONANCE; MATHEMATICAL MODELS; PARAMAGNETIC RESONANCE; SEMICONDUCTING SILICON; THERMAL EFFECTS; THIN FILMS;

MICROCRYSTALLINE MATERIALS;

SEMICONDUCTING FILMS;

EID: 0032065058 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3093(98)00255-5 Document Type: Article

Times cited : (26)

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