Light induced defect creation kinetics in thin film protocrystalline silicon materials and their solar cells

Materials Research Society Symposium - Proceedings

Volumn 715, Issue , 2002, Pages 459-470

  Wronski, C R ^a   Pearce, J M ^a   Koval, R J ^a   Niu, X ^a   Ferlauto, A S ^a   Koh, J ^a   Collins, R W ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL MICROSTRUCTURE; ELECTRON MOBILITY; ELLIPSOMETRY; KINETIC THEORY; PHASE DIAGRAMS; SOLAR CELLS; TEMPERATURE; THIN FILMS;

FILL FACTOR; PROTOCRYSTALLINE SILICON MATERIALS; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; SUBGAP ABSORPTION;

SILICON;

EID: 0036928534     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-715-a13.4     Document Type: Conference Paper

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