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Volumn 74, Issue 13, 1999, Pages 1860-1862

Structural, defect, and device behavior of hydrogenated amorphous Si near and above the onset of microcrystallinity

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; DEPOSITION; FILM GROWTH; HYDROGENATION; SOLAR CELLS; STAINLESS STEEL; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0032608065     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123693     Document Type: Article
Times cited : (183)

References (15)
  • 1
    • 0031354607 scopus 로고    scopus 로고
    • and other review papers in this volume
    • See, e.g., H. Fritzsche, Mater. Res. Soc. Symp. Proc. 467, 19 (1997), and other review papers in this volume.
    • (1997) Mater. Res. Soc. Symp. Proc. , vol.467 , pp. 19
    • Fritzsche, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.