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Physica Status Solidi - Rapid Research Letters

Volumn 1, Issue 2, 2007, Pages

Defects in thin film silicon at the transition from amorphous to microcrystalline structure

(6) Astakhov, O a,b Carius, R a Petrusenko, Yu b Borysenko, V b Barankov, D b Finger, F a

a FORSCHUNGSZENTRUM JÜLICH (Germany)

b KHARKOV INSTITUTE OF PHYSICS AND TECHNOLOGY (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CRYSTAL GROWTH; DEFECTS; ELECTRON BEAMS; ELECTRON IRRADIATION; MICROCRYSTALLINE SILICON; PARAMAGNETIC RESONANCE; SEMICONDUCTING SILICON;

ELECTRON BEAM IRRADIATION; PARAMAGNETIC DEFECTS; THIN FILM SILICON;

THIN FILMS;

EID: 38749125824 PISSN: 18626254 EISSN: 18626270 Source Type: Journal
DOI: 10.1002/pssr.200600065 Document Type: Article

Times cited : (10)

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