Electron spin resonance studies of microcrystalline and amorphous silicon irradiated with high energy electrons

Journal of Non-Crystalline Solids

Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1020-1023

  Astakhov, Oleksandr ^a   Finger, Friedhelm ^a   Carius, Reinhard ^a   Lambertz, Andreas ^a   Petrusenko, Yuri ^a   Borysenko, Valery ^a   Barankov, Dmitriy ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Defects; Electron spin resonance; Silicon

Indexed keywords

AMORPHOUS SILICON; ANNEALING; DEFECTS; ELECTRONS; HIGH ENERGY PHYSICS; IRRADIATION; PARAMAGNETISM; SILICON; STRUCTURE (COMPOSITION);

ELECTRON BOMBARDMENT; HIGH ENERGY ELECTRONS; PARAMAGNETIC DEFECTS; SPIN DENSITY;

PARAMAGNETIC RESONANCE;

EID: 33745433500     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.01.060     Document Type: Article

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