Defects and recombination in microcrystalline silicon

Solar Energy Materials and Solar Cells

Volumn 78, Issue 1-4, 2003, Pages 513-541

  Lips, K ^a   Kanschat, P ^a   Fuhs, W ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Defects; Magnetic resonance; Morphology; Recombination; Transport

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; ELECTRON SPIN RESONANCE SPECTROSCOPY; ELECTRON TUNNELING; METAL INSULATOR TRANSITION; MORPHOLOGY; PARAMAGNETIC RESONANCE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTOR DOPING; TRANSPORT PROPERTIES;

MICROCRYSTALLINE SILICON;

SEMICONDUCTING SILICON;

EID: 0038446365     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(02)00450-6     Document Type: Article

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