Nanomechanical measurements with AFM in the elastic limit

Advances in Colloid and Interface Science

Volumn 120, Issue 1-3, 2006, Pages 57-67

  Withers, John R ^a   Aston, D Eric ^a  

^a UNIVERSITY OF IDAHO   (United States)

Author keywords

Atomic force microscopy; Elastic modulus; Nanoindentation; Nanomechanics; Three point bend test

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; DENDRIMERS; ELASTIC MODULI; NANOSTRUCTURED MATERIALS; STRENGTH OF MATERIALS; THIN FILMS;

NANOINDENTATION; NANOMECHANICS; THREE-POINT BEND TEST;

NANOTECHNOLOGY;

EID: 33747070852     PISSN: 00018686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cis.2006.03.002     Document Type: Review

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