Scanning force microscopy - Calibrative procedures for 'best practice'

Scanning

Volumn 19, Issue 8, 1997, Pages 564-581

  Gibson, C T ^a   Watson, G S ^a   Myhra, S ^a  

^a GRIFFITH UNIVERSITY   (Australia)

Author keywords

Best practise; Force constants; Probe calibration; Scan parameters; Scanning force microscopy

Indexed keywords

ARTICLE; ARTIFACT; CALIBRATION; IMAGE ANALYSIS; METHODOLOGY; PRACTICE GUIDELINE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SENSOR;

EID: 0031390745     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950190806     Document Type: Article

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