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Volumn 67, Issue 7, 1996, Pages 2560-2567

Quantitative analysis of lateral force microscopy experiments

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000279297     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147214     Document Type: Article
Times cited : (135)

References (36)
  • 23
    • 0004130754 scopus 로고    scopus 로고
    • Digital Instruments, Santa Barbara, CA
    • Nanoscope III, Digital Instruments, Santa Barbara, CA.
    • Nanoscope III
  • 28
    • 85040875608 scopus 로고
    • Cambridge University Press, Cambridge
    • K. L. Johnson, Contact Mechanics (Cambridge University Press, Cambridge, 1994), pp. 84-152.
    • (1994) Contact Mechanics , pp. 84-152
    • Johnson, K.L.1
  • 31
    • 85033866924 scopus 로고    scopus 로고
    • note
    • It might be worth pointing out that with the data analysis procedure proposed, it is possible to calculate the errors of any parameter even if general microscopic friction laws are assumed. This is contrary, e.g., to the method proposed by Putman et al. (Ref. 17) which is only applicable to a linear model.
  • 33
    • 84876765554 scopus 로고    scopus 로고
    • Aidlingen, Germany
    • Nanosensors, Aidlingen, Germany.
    • Nanosensors


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.