Curvature radius analysis for scanning probe microscopy

Surface Science

Volumn 585, Issue 1-2, 2005, Pages 25-37

  Mazeran, Pierre Emmanuel ^a   Odoni, Ludovic ^b   Loubet, Jean Luc ^b  

^a UNIVERSITÉ DE TECHNOLOGIE DE COMPIÈGNE   (France)

^b LABORATOIRE DE TRIBOLOGIE ET DYNAMIQUE DES SYSTÈMES   (France)

Author keywords

Atomic force microscopy; Curvature; Morphology; Radius; Scanning tunneling microscopy; Tip; Topography

Indexed keywords

ALGORITHMS; ATOMIC FORCE MICROSCOPY; COMPUTATIONAL METHODS; CURVE FITTING; SCANNING; SCANNING TUNNELING MICROSCOPY; SURFACE TOPOGRAPHY;

CURVATURE; CURVATURE RADIUS ANALYSIS; RADIUS; SCANNING PROBE MICROSCOPY; TIP;

SURFACE MEASUREMENT;

EID: 20044394787     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.04.005     Document Type: Article

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