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Volumn 110, Issue 4, 2006, Pages 1382-1388

Measuring the size dependence of young's modulus using force modulation atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

FORCE MODULATION SPECTROSCOPY; MICROSCOPY MEASUREMENTS; NANOMETER SCALE;

EID: 32544432877     PISSN: 10895639     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0544540     Document Type: Article
Times cited : (54)

References (69)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.