Force modulation with a scanning force microscope: An analysis

Tribology Letters

Volumn 3, Issue 1, 1997, Pages 125-132

  Mazeran, Pierre Emmanuel ^a   Loubet, Jean Luc ^a  

^a LABORATOIRE DE TRIBOLOGIE ET DYNAMIQUE DES SYSTÈMES   (France)

Author keywords

Cantilever natural frequency; Contact stiffness; Force modulation; Model; Scanning force microscope; Young modulus

Indexed keywords

EID: 2342472171     PISSN: 10238883     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1019123525610     Document Type: Article

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