Application of atomic force microscopy to the study of micromechanical properties of biological materials

Biotechnology Letters

Volumn 22, Issue 11, 2000, Pages 893-903

  Bowen, W Richard ^a   Lovitt, Robert W ^a   Wright, Chris J ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Adhesion; AFM; Force measurement; Nanoindentation; Nanomanipulation

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; DEVICE; DIAGNOSTIC IMAGING; NONHUMAN; SCANNING ELECTRON MICROSCOPE; SENSOR; SURFACE PROPERTY; YEAST CELL;

EID: 0033936498     PISSN: 01415492     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1005604028444     Document Type: Article

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