Polymer nanowire elastic moduli measured with digital pulsed force mode AFM

Langmuir

Volumn 21, Issue 22, 2005, Pages 10214-10218

  Shanmugham, Saravanarajan ^a   Jeong, Jonghwa ^a   Alkhateeb, Abdullah ^a   Aston, D Eric ^a  

^a UNIVERSITY OF IDAHO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL PULSED FORCE MODES (DPFM); NANOMECHANICAL TESTING; NANOSCIENCE; POLYMER NANOWIRES;

ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; ELASTIC MODULI; ERRORS; INDENTATION; MOLDING; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; POLYMERS; POLYPYRROLES; SILICON;

WIRE;

EID: 27544491724     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la050538o     Document Type: Article

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