Imaging nanoscopic elasticity of thin film materials by atomic force microscopy: Effects of force modulation frequency and amplitude

Langmuir

Volumn 15, Issue 19, 1999, Pages 6495-6504

  Jourdan, J S ^a   Cruchon Dupeyrat, S J ^a   Huan, Y ^a   Kuo, P K ^a   Liu, G Y ^a  

^a WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION; IMAGING TECHNIQUES; MICA; MONOLAYERS; STIFFNESS; THIN FILMS; VISCOELASTICITY;

DYNAMIC FORCE MODULATION (DFM); FORCE MODULATION MICROSCOPY (FMM); OCTADECYLTRIETHOXYSILANE;

SILANES;

EID: 0032642745     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9902183     Document Type: Article

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