Ultra-high resolution photonic crystal nano-probe for high density optical data storage, near field microscopy and nanolithography systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6128, Issue , 2006, Pages

  Sharkawy, Ahmed ^a   Bermnhan, Greg ^a   Shi, Shouyuan ^b   Dillion, Thomas ^b   Prather, Dennis W ^b  

^a EM PHOTONICS INC   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

Nano Probe; Nanolithography; Near Field Microscopy; Optical Data Storage; Photonic Crystals

Indexed keywords

OPTICAL DATA STORAGE; OPTICAL DEVICES; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; OPTIMIZATION; PHOTONS;

NANO-PROBE; NANOLITHOGRAPHY; NEAR FIELD MICROSCOPY; PHOTONIC CRYSTALS;

NANOTECHNOLOGY;

EID: 33745604253     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.646070     Document Type: Conference Paper

References (106)

1. N. F. Vanhulst, M. H. P. Moers, and B. Bolger, "Near-Field Optical Microscopy in Transmission and Reflection Modes in Combination with Force Microscopy," Journal of Microscopy-Oxford, vol. 171, pp. 95-105, 1993.
2. N. F. Vanhulst, N. P. Deboer, and B. Bolger, "An Evanescent-Field Optical Microscope," Journal of Microscopy-Oxford, vol. 163, pp. 117-130, 1991.
3. M. Isaacson, J. Cline, and H. Barshatzky, "Resolution in near-Field Optical Microscopy," Ultramicroscopy, vol. 47, pp. 15-22, 1992.
4. D. W. Pohl, H. Bach, M. A. Bopp, V. Deckert, P. Descouts, R. Eckert, H. J. Guntherodt, C. Hafner, B. Hecht, H. Heinzelmann, T. Huser, M. Jobin, U. Keller, T. Lacoste, P. Lambelet, F. MarquisWeible, O. J. F. Martin, A. J. Meixner, B. Nechay, L. Novotny, M. Pfeiffer, C. Philipona, T. Plakhotnik, A. Renn, A. Sayah, J. M. Segura, B. Sick, U. Siegner, G. Tarrach, R. Vahldieck, U. P. Wild, D. Zeisel, and R. Zenobi, "Optical microscopy in the nano-world," Chimia, vol. 51, pp. 760-767, 1997.
5. T. R. M. Sales and G. M. Morris, "Diffractive superresolution elements," Journal of the Optical Society of America a-Optics Image Science and Vision, vol. 14, pp. 1637-1646, 1997.
6. D. V. Kazantsev, "A simple scanning head for scanning near-field optical microscope," Ultramicroscopy, vol. 71, pp. 191-198, 1998.
7. D. V. Palanker, G. M. H. Knippels, T. I. Smith, and H. A. Schwettman, "IR microscopy with a transient photo-induced near-field probe (tipless near-field microscopy)," Optics Communications, vol. 148, pp. 215-220, 1998.
8. C. Durkan and I. V. Shvets, "40nm resolution in reflection-mode SNOM with lambda=685 nm," Ultramicroscopy, vol. 61, pp. 227-231, 1995.
9. A. J. Meixner, D. Zeisel, M. A. Bopp, and G. Tarrach, "Superresolution Imaging and Detection of Fluorescence from Single Molecules by Scanning near-Field Optical Microscopy," Optical Engineering, vol. 34, pp. 2324-2332, 1995.
10. U. C. Fischer, J. Heimel, H. J. Maas, H. Fuchs, J. C. Weeber, and A. Dereux, "Super-resolution scanning near-field optical microscopy," in Optical Nanotechnologies: The Manipulation of Surface and Local Plasmons, vol. 88, Topics in Applied Physics. Berlin: SPRINGER-VERLAG BERLIN, 2003, pp. 141-152.
11. D. W. Pohl, U. C. Fischer, and U. T. Durig, "Scanning near-Field Optical Microscopy (Snom)," Journal of Microscopy-Oxford, vol. 152, pp. 853-861, 1988.
12. U. C. Fischer, U. T. Durig, and D. W. Pohl, "Scanning near-Field Optical Microscopy (Snom) in Reflection or Scanning Optical Tunneling Microscopy (Sotm)," Scanning Microscopy, vol. 3, pp. 1-7, 1989.
13. M. S. Wang and J. M. Borrego, "High-Resolution Scanning Microwave Electric-Field Probe for Dielectric-Constant Uniformity Measurement," Materials Evaluation, vol. 48, pp. 1106-1109, 1990.
14. E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, "Breaking the Diffraction Barrier - Optical Microscopy on a Nanometric Scale," Science, vol. 251, pp. 1468-1470, 1991.
15. A. Dereux, J. P. Vigneron, P. Lambin, and A. A. Lucas, "Theory of near-Field Optics with Applications to Snom and Optical Binding," Physica B, vol. 175, pp. 65-67, 1991.
16. K. Cho, Y. Ohfuti, and K. Arima, "Study of Scanning near-Field Optical Microscopy (Snom) by Nonlocal Response Theory," Japanese Journal of Applied Physics Part 2-Letters, vol. 34, pp. 267-270, 1994.
17. M. Fujihira, H. Monobe, H. Muramatsu, and T. Ataka, "Scanning near-Field Fluorescence Microscopy and Nanoscopic Fluorescence Spectroscopy in Combination with a Noncontact Scanning Force Microscope," Chemistry Letters, pp. 657-660, 1994.
18. S. Kirstein, "Scanning near-field optical microscopy," Current Opinion in Colloid & Interface Science, vol. 4, pp. 256-264, 1999.
19. S. Davy, D. Barchiesi, M. Spajer, and D. Courjon, "Spectroscopic study of resonant dielectric structures in near-field," European Physical Journal-Applied Physics, vol. 5, pp. 277-281, 1999.
20. A. Born and R. Wiesendanger, "Scanning probe microscopy and Spectroscopy: From basic research to industrial applications," Informacije Midem-Journal of Microelectronics Electronic Components and Materials, vol. 27, pp. 246-250, 1997.
21. C. Coluzza, "Spectromicroscopy and chemical imaging applied to the study of photocathode materials and devices," Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, vol. 387, pp. 24-32, 1997.
22. O. Bergossi, R. Bachelot, H. Wioland, G. Wurtz, R. Laddada, P. M. Adam, J. L. Bijeon, and P. Royer, "Near field optical microscopy and Spectroscopy with STM and AFM probes," Acta Physica Polonica A, vol. 93, pp. 393-398, 1998.
23. K. D. Jandt, "Developments and perspectives of scanning probe microscopy (SPM) on organic materials systems," Materials Science & Engineering R-Reports, vol. 21, pp. 221-295, 1998.
24. C. Girard, "Theoretical-Analysis of Scanning near-Field Optical Microscopy," Scanning, vol. 16, pp. 333-342, 1994.
25. H. Heinzelmann and D. W. Pohl, "Scanning near-Field Optical Microscopy," Applied Physics a-Materials Science & Processing, vol. 59, pp. 89-101, 1994.
26. R. J. Pylkki, P. J. Moyer, and P. E. West, "Scanning near-Field Optical Microscopy and Scanning Thermal Microscopy," Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, vol. 33, pp. 3785-3790, 1994.
27. F. Reineke, S. Kammer, and S. Gehring, "Operating Modes in Scanning Probe Microscopy," in Defect Recognition and Image Processing in Semiconductors and Devices, Institute of Physics Conference Series. Bristol: IOP PUBLISHING LTD, 1994, pp. 61-64.
28. X. S. Xie and R. C. Dunn, "Probing Single-Molecule Dynamics," Science, vol. 265, pp. 361-364, 1994.
29. M. Fujihira, H. Monobe, N. Yamamoto, H. Muramatsu, N. Chiba, K. Nakajima, and T. Ataka, "Scanning near-field optical microscopy of fluorescent polystyrene spheres with a combined SNOM and AFM," Ultramicroscopy, vol. 61, pp. 271-277, 1995.
30. K. K. Cho, Y. Ohfuti, and K. Arima, "Theory of resonant SNOM (scanning near-field optical microscopy): Breakdown of the electric dipole selection rule in the reflection mode," Surface Science, vol. 363, pp. 378-384, 1996.
31. H. Heinzelmann, B. Hecht, L. Novotny, and D. W. Pohl, "Forbidden Light Scanning near-Field Optical Microscopy," Journal of Microscopy-Oxford, vol. 177, pp. 115-118, 1995.
32. O. J. F. Martin, C. Girard, and A. Dereux, "Light Confinement by Subwavelength Objects in near-Field Optics," Helvetica Physica Acta, vol. 68, pp. 195-196, 1995.
33. W. Gutmannsbauer, T. Huser, T. Lacoste, H. Heinzelmann, and H. J. Guntherodt, "Scanning near-Field Optical Microscopy (Snom) and Its Application in Mineralogy," Schweizerische Mineralogische Und Petrographische Mitteilungen, vol. 75, pp. 259-264, 1995.
34. C. Bornkessel and W. Wiesbeck, "Numerical analysis and optimization of anechoic chambers for EMC testing," Ieee Transactions on Electromagnetic Compatibility, vol. 38, pp. 499-506, 1996.
35. G. Krausch, "Scanning probe microscopy with "chemical sensitivity"," in Advances in Solid State Physics, Vol 35, vol. 35, Festkorperprobleme-Advances in Solid State Physics. Wiesbaden: FRIEDRICH VIEWEG & SOHN VERLAGSGESELLSCHAFT MBH, 1996, pp. 303-320.
36. H. Muramatsu, N. Chiba, T. Ataka, S. Iwabuchi, N. Nagatani, E. Tamiya, and M. Fujihira, "Scanning near-field optical/atomic force microscopy for fluorescence imaging and spectroscopy of biomaterials in air and liquid: Observation of recombinant Escherichia coli with gene coding to green fluorescent protein," Optical Review, vol. 3, pp. 470-474, 1996.
37. T. J. Silva and S. Schultz, "A scanning near-field optical microscope for the imaging of magnetic domains in reflection," Review of Scientific Instruments, vol. 67, pp. 715-725, 1996.
38. R. Brunner, A. Bietsch, O. Hollricher, O. Marti, and A. Lambacher, "Application of a near-field optical microscope to investigate the fluorescence energy transfer between chromophores embedded in Langmuir-Blodgett films," Surface and Interface Analysis, vol. 25, pp. 492-&, 1997.
39. S. J. Bukofsky, S. A. Selberg, R. D. Grober, and J. K. Trautman, "Application of near-field optics to critical dimension metrology," Applied Physics Letters, vol. 70, pp. 2368-2370, 1997.
40. R. M. Cramer, R. Heiderhoff, J. Selbeck, and L. J. Balk, "Advanced scanning near-field optical microscopy of semiconducting materials and devices," in Microscopy of Semiconducting Materials 1997, Institute of Physics Conference Series. Bristol: IOP PUBLISHING LTD, 1997, pp. 685-688.
41. S. R. Emory and S. M. Nie, "Near-field surface-enhanced Raman spectroscopy on single silver nanoparticles," Analytical Chemistry, vol. 69, pp. 2631-2635, 1997.
42. T. Fujimura, K. Edamatsu, T. Itoh, R. Shimada, A. Imada, T. Koda, N. Chiba, H. Muramatsu, and T. Ataka, "Scanning near-field optical images of ordered polystyrene particle layers in transmission and luminescence excitation modes," Optics Letters, vol. 22, pp. 489-491, 1997.
43. G. Kaupp and A. Herrmann, "Chemical contrast in scanning near-field optical microscopy," Journal of Physical Organic Chemistry, vol. 10, pp. 675-&, 1997.
44. T. H. Keller, T. Rayment, D. Klenerman, and R. J. Stephenson, "Scanning near-field optical microscopy in reflection mode imaging in liquid," Review of Scientific Instruments, vol. 68, pp. 1448-1454, 1997.
45. W. Wiegrabe, S. Monajembashi, H. Dittmar, K. O. Greulich, S. Hafner, M. Hildebrandt, M. Kittler, B. Lochner, and E. Unger, "Scanning near-field optical microscope: A method for investigating chromosomes," Surface and Interface Analysis, vol. 25, pp. 510-&, 1997.
46. M. Fujihira, H. Monobe, A. Koike, G. R. Ivanov, H. Muramatsu, N. Chiba, N. Yamamoto, and T. Ataka, "Application of scanning near-field optical microscopy to thin organic film devices," Ultramicroscopy, vol. 71, pp. 269-274, 1998.
47. A. J. Meixner and H. Kneppe, "Scanning near-field optical microscopy in cell biology and microbiology," Cellular and Molecular Biology, vol. 44, pp. 673-688, 1998.
48. S. Webster, D. N. Batchelder, and D. A. Smith, "Submicron resolution measurement of stress in silicon by near-field Raman spectroscopy," Applied Physics Letters, vol. 72, pp. 1478-1480, 1998.
49. V. Coello and S. I. Bozhevolnyi, "Near-field optical microscopy of fractal structures," Nanotechnology, vol. 10, pp. 108-112, 1999.
50. R. Micheletto, M. Denyer, M. Scholl, K. Nakajima, M. Kara, and W. Knoll, "In vitro monitoring of live cardiomyocytes dynamics by a scanning near field optical microscope setup," Optical Review, vol. 6, pp. 268-271, 1999.
51. P. L. Phillips, J. C. Knight, B. J. Mangan, P. S. J. Russell, M. D. B. Charlton, and G. J. Parker, "Near-field optical microscopy of thin photonic crystal films," Journal of Applied Physics, vol. 85, pp. 6337-6342, 1999.
52. T. Yoshino, S. Sugiyama, S. Hagiwara, D. Fukushi, M. Shichiri, H. Nakao, J. M. Kim, T. Hirose, H. Muramatsu, and T. Ohtani, "Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy," Ultramicroscopy, vol. 97, pp. 81-87, 2003.
53. S. Tascu, P. Moretti, S. Kostritskii, and B. Jacquier, "Optical near-field measurements of guided modes in various processed LiNbO3 and LiTaO3 channel waveguides," Optical Materials, vol. 24, pp. 297-302, 2003.
54. M. Labardi, N. Coppede, L. Pardi, M. Allegrini, M. Giordano, S. Patane, A. Arena, and E. Cefali, "Sub-micron scale optical read/write/erase on azo-polymethacrylate thin films by scanning near-field optical microscopy," Molecular Crystals and Liquid Crystals, vol. 398, pp. 33-43, 2003.
55. C. Hoppener, D. Molenda, H. Fuchs, and A. Naber, "Scanning near-field optical microscopy of a cell membrane in liquid," Journal of Microscopy-Oxford, vol. 210, pp. 288-293, 2003.
56. H. Muramatsu and J. M. Kim, "Near-field optical microscopy with video signal processor to apply a CCD imaging device as a variable area photo-sensor for improving operability and spectrum mode imaging," Ultramicroscopy, vol. 91, pp. 83-88, 2002.
57. B. Knoll and F. Keilmann, "Scanning microscopy by mid-infrared near-field scattering," Applied Physics a-Materials Science & Processing, vol. 66, pp. 477-481, 1998.
58. L. A. Gheber, J. Hwang, and M. Edidin, "Design and optimization of a near-field scanning optical microscope for imaging biological samples in liquid," Applied Optics, vol. 37, pp. 3574-3581, 1998.
59. D. Zeisel, B. Dutoit, V. Deckert, T. Roth, and R. Zenobi, "Optical spectroscopy and laser desorption on a nanometer scale," Analytical Chemistry, vol. 69, pp. 749-754, 1997.
60. D. Barchiesi, O. Bergossi, C. Pieralli, and M. Spajer, "Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe - Image interpretation and resolution for high topographic variations," Ultramicroscopy, vol. 71, pp. 361-370, 1998.
61. J. Barenz, P. Anger, O. Hollricher, O. Marti, M. Wachter, R. Butendeich, and H. Heinecke, "Spatially resolved near-field spectroscopy on localized GalnAsP/InP double heterostructures," Journal of Applied Physics, vol. 83, pp. 870-876, 1998.
62. A. Cricenti, R. Generosi, C. Barchesi, M. Luce, M. Rinaldi, C. Coluzza, P. Perfetti, G. Margaritondo, D. T. Schaafsma, I. D. Aggarwal, J. M. Gilligan, and N. H. Tolk, "First experimental results with the free electron laser coupled to a scanning near-field optical microscope," Physica Status Solidi a-Applied Research, vol. 170, pp. 241-247, 1998.
63. S. Heisig, H. U. Danzebrink, A. Leyk, W. Mertin, S. Munster, and E. Oesterschulze, "Monolithic gallium arsenide cantilever for scanning near-field microscopy," Ultramicroscopy, vol. 71, pp. 99-105, 1998.
64. R. Stevenson and D. Richards, "The use of a near-field probe for the study of semiconductor heterostructures," Semiconductor Science and Technology, vol. 13, pp. 882-886, 1998.
65. N. H. Lu, D. P. Tsai, C. S. Chang, and T. T. Tsong, "Optical characterization of visible multiquantum-well semiconductor lasers by collection/excitation modes of scanning near-field optical microscopy," Applied Physics Letters, vol. 74, pp. 2746-2748, 1999.
66. K. P. Gaikovich, V. F. Dryakhlushin, V. V. Levichev, and V. P. Mishkin, "Study of near-field emission of semiconductor laser," Physics of Low-Dimensional Structures, vol. 3-4, pp. 55-59, 2003.
67. S. Nomura, K. Matsuda, T. Saiki, and Y. Aoyagi, "Near-field scanning optical microscopy of quantum dot arrays," Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, vol. 41, pp. 2668-2670, 2002.
68. S. Wang, "Near-field optical image of a homogeneous dielectric surface structure: A passive probe model," Optics Communications, vol. 143, pp. 179-184, 1997.
69. A. J. Ward and J. B. Pendry, "The theory of SNOM: A novel approach," Journal of Modern Optics, vol. 44, pp. 1703-1714, 1997.
70. E. Paule and P. Reineker, "Near-field optical microscopy: A numerical study of resolution and contrast," Journal of Luminescence, vol. 76-7, pp. 299-302, 1998.
71. B. Dragnea, J. Preusser, W. Schade, S. R. Leone, and W. D. Hinsberg, "Transmission near-field scanning microscope for infrared chemical imaging," Journal of Applied Physics, vol. 86, pp. 2795-2799, 1999.
72. X. P. Sun, B. L. Zhang, and E. K. Wang, "Application of scanning probe microscopy in nanofabrication," Chinese Journal of Analytical Chemistry, vol. 31, pp. 1127-1130, 2003.
73. H. Zhang, S. W. Chung, and C. A. Mirkin, "Fabrication of sub-50-nm solid-state nanostructures on the basis of dip-pen nanolithography," Nano Letters, vol. 3, pp. 43-45, 2003.
74. K. Sattler, "Nanolithography using the scanning tunneling microscope," Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, vol. 42, pp. 4825-4829, 2003.
75. H. Iwasaki, T. Yoshinobu, and K. Sudoh, "Nanolithography on SiO2/Si with a scanning tunnelling microscope," Nanotechnology, vol. 14, pp. R55-R62, 2003.
76. L. Demers and G. della Cioppa, "Nanotechnology to advance discovery R&D - Tutorial: Dip pen nanolithography as a next-generation, massively parallel nanoarray platform," Genetic Engineering News, vol. 23, pp. 36-+, 2003.
77. J. H. Bae, T. Ono, and M. Esashi, "Scanning probe with an integrated diamond heater element for nanolithography," Applied Physics Letters, vol. 82, pp. 814-816, 2003.
78. A. Okazaki, S. Akita, and Y. Nakayama, "Scanning probe microscope lithography of silicon using a combination of a carbon nanotube tip and a polysilane film as a mask," Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, vol. 41, pp. 4973-4975, 2002.
79. S. Hosaka, S. Hosoki, T. Hasegawa, H. Koyanagi, T. Shintani, and M. Miyamoto, "Fabrication of nanostructures using scanning probe microscopes," Journal of Vacuum Science & Technology B, vol. 13, pp. 2813-2818, 1995.
80. T. H. Dam and P. Pantano, "Nanotip array photoimprint lithography," Review of Scientific Instruments, vol. 70, pp. 3982-3986, 1999.
81. M. Kato, A. Kiguchi, M. Ishibashi, and S. Heike, "Fabrication and observation of a standard sample for near-field optical microscopy," Journal of Microscopy-Oxford, vol. 194, pp. 558-560, 1999.
82. B. Klehn and U. Kunze, "Nanolithography with an atomic force microscope by means of vector-scan controlled dynamic plowing," Journal of Applied Physics, vol. 85, pp. 3897-3903, 1999.
83. H. J. Mamin, R. P. Ried, B. D. Terris, and D. Rugar, "High-density data storage based on the atomic force microscope," Proceedings of the Ieee, vol. 87, pp. 1014-1027, 1999.
84. H. M. Wu, Y. L. Song, Y. Q. Wen, T. Zhao, H. J. Gao, and L. Jiang, "Progress in materials and technologies for ultrahigh density data storage," Progress in Natural Science, vol. 13, pp. 247-253, 2003.
85. F. F. Schrey, E. E. Chaban, M. J. Matthews, and J. W. P. Hsu, "A microscope for imaging, spectroscopy, and lithography at the nanometer scale: Combination of a two-photon laser scanning microscope and an atomic force microscope," Review of Scientific Instruments, vol. 74, pp. 1211-1216, 2003.
86. B. D. Terris, H. J. Mamin, D. Rugar, W. R. Studenmund, and G. S. Kino, "Near-Field Optical-Data Storage Using a Solid Immersion Lens," Applied Physics Letters, vol. 65, pp. 388-390, 1994.
87. T. W. McDaniel and P. C. Arnett, "Optical data storage media," Ibm Journal of Research and Development, vol. 40, pp. 311-330, 1996.
88. B. D. Terris, H. J. Mamin, and D. Rugar, "Near-field optical data storage," Applied Physics Letters, vol. 68, pp. 141-143, 1996.
89. V. A. Joshkin, J. C. Roberts, F. G. McIntosh, S. M. Bedair, E. L. Piner, and M. K. Behbehani, "Optical memory effect in GaN epitaxial films," Applied Physics Letters, vol. 71, pp. 234-236, 1997.
90. Y. Martin, S. Rishton, and H. K. Wickramasinghe, "Optical data storage read out at 256 Gbits/in(2)," Applied Physics Letters, vol. 71, pp. 1-3, 1997.
91. D. W. Pohl, "Near field optics: Comeback of light in microscopy," Solid State Phenomena, vol. 63-4, pp. 251-255, 1998.
92. H. van Houten and J. Schleipen, "Optical data storage," Physics World, vol. 11, pp. 33-37, 1998.
93. U. Brand, G. Hester, J. Grochmalicki, and R. Pike, "Super-resolution in optical data storage," Journal of Optics a-Pure and Applied Optics, vol. 1, pp. 794-800, 1999.
94. C. S, Fokas, "Scanning near-field optical microscopy," Nachrichten Aus Chemie Technik Und Laboratorium, vol. 47, pp. 64S-+, 1999.
95. D. R. Huang, Z. W. Chao, G. Z. Wu, and E. G. Lean, "Near-field recording head with simple tracking design," Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, vol. 38, pp. 1774-1776, 1999.
96. S. Hosaka, T. Shintani, A. Kikukawa, and K. Itoh, "Nano-optical image and probe in a scanning near-field optical microscope," Applied Surface Science, vol. 140, pp. 388-393, 1999.
97. T. Leinhos, O. Rudow, M. Stopka, A. Vollkopf, and E. Oesterschulze, "Coaxial probes for scanning near-field microscopy," Journal of Microscopy-Oxford, vol. 194, pp. 349-352, 1999.
98. R. Kassing, I. W. Rangelow, E. Oesterschulze, and M. Stuke, "Sensors for scanning probe microscopy," Applied Physics a-Materials Science & Processing, vol. 76, pp. 907-911, 2003.
99. M. A. Poggi, L. A. Bottomley, and P. T. Lillehei, "Scanning probe microscopy," Analytical Chemistry, vol. 74, pp. 2851-2862, 2002.
100. M. Ohtsu, K. Kobayashi, T. Kawazoe, S. Sangu, and T. Yatsui, "Nanophotonics: Design, fabrication, and operation of nanometric devices using optical near fields," Ieee Journal of Selected Topics in Quantum Electronics, vol. 8, pp. 839-862, 2002.
101. R. Laddada, P. M. Adam, P. Royer, and J. L. Bijeon, "Apertureless near-field optical microscope in reflection and transmission modes," Optical Engineering, vol. 37, pp. 2142-2147, 1998.
102. P. Lambelet, M. Pfeffer, A. Sayah, and F. Marquis-Weible, "Reduction of tip-sample interaction forces for scanning near-field optical microscopy in a liquid environment," Ultramicroscopy, vol. 71, pp. 117-121, 1998.
103. Y. Mitsuoka, K. Nakajima, K. Homma, N. Chiba, H. Muramatsu, T. Ataka, and K. Sato, "Polarization properties of light emitted by a bent optical fiber probe and polarization contrast in scanning near-field optical microscopy," Journal of Applied Physics, vol. 83, pp. 3998-4003, 1998.
104. V. Sandoghdar and J. Mlynek, "Prospects of apertureless SNOM with active probes," Journal of Optics a-Pure and Applied Optics, vol. 1, pp. 523-530, 1999.
105. S. Kawata, "Photorefractive optics in three-dimensional digital memory," Proceedings of the Ieee, vol. 87, pp. 2009-2020, 1999.
106. G. Friedbacher and H. Fuchs, "Classification of scanning probe microscopies - (Technical report)," Pure and Applied Chemistry, vol. 71, pp. 1337-1357, 1999.