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Volumn 148, Issue 4-6, 1998, Pages 215-220
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IR microscopy with a transient photo-induced near-field probe (tipless near-field microscopy)
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Author keywords
IR microscopy; Near field microscopy; Photo induced reflectivity
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Indexed keywords
INFRARED RADIATION;
LASER BEAM EFFECTS;
LIGHT REFLECTION;
LIGHT SCATTERING;
OPTICAL FIBERS;
OPTICAL MICROSCOPY;
OPTICAL RESOLVING POWER;
PROBES;
SEMICONDUCTOR MATERIALS;
INFRARED MICROSCOPY;
NEAR FIELD MICROSCOPY;
MIRRORS;
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EID: 0032022738
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(97)00702-5 Document Type: Article |
Times cited : (33)
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References (19)
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