Spectromicroscopy and chemical imaging applied to the study of photocathode materials and devices

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 387, Issue 1-2, 1997, Pages 24-32

  Coluzza, C ^a  

^a UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; IMAGING TECHNIQUES; INTERFACES (MATERIALS); MORPHOLOGY; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PHOTOCONDUCTIVITY; PHOTODETECTORS; PHOTOEMISSION; QUANTUM EFFICIENCY; SURFACE PROPERTIES;

CHEMICAL IMAGING; SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM); SPECTROMICROSCOPY;

PHOTOCATHODES;

EID: 0031099045     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00953-9     Document Type: Article

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