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Volumn 143, Issue 4-6, 1997, Pages 179-184
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Near-field optical image of a homogeneous dielectric surface structure: A passive probe model
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Author keywords
Microscopy; Near field optics; PSTM; SNOM; Theoretical modeling
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Indexed keywords
COMPUTER SIMULATION;
DIELECTRIC MATERIALS;
LIGHT POLARIZATION;
MATHEMATICAL MODELS;
PHOTONS;
REFRACTIVE INDEX;
SCANNING TUNNELING MICROSCOPY;
SUBSTRATES;
SURFACE STRUCTURE;
NEAR FIELD OPTICS;
OPTICAL CORRELATION;
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EID: 0031274941
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(97)00409-4 Document Type: Article |
Times cited : (8)
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References (17)
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