Scanning near-field optical microscope: A method for investigating chromosomes

Surface and Interface Analysis

Volumn 25, Issue 7-8, 1997, Pages 510-513

  Wiegrabe W ^a,b   Monajembashi, S ^a   Dittmar, H ^a   Greulich, K O ^a   Hafner S ^a   Hildebrandt, M ^a   Kittler, M ^a   Lochner, B ^a   Unger, E ^a  

^a FRITZ LIPMANN INSTITUTE   (Germany)

^b CARL ZEISS SMT AG   (Germany)

Author keywords

AFM; Chromosome; DNA; Giemsa; Karyotype; NSOM; Propidium iodide; Scanning force microscope; Scanning near field optical microscope; SFM; SNOM

Indexed keywords

DNA; ELECTROMAGNETIC WAVE DIFFRACTION; FLUORESCENCE; IODINE COMPOUNDS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER;

KARYOTYPES; PROPIDIUM IODIDE; SCANNING FORCE MICROSCOPY (SFM); SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM);

CHROMOSOMES;

EID: 0031152889     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199706)25:7/8<510::aid-sia260>3.0.co;2-s     Document Type: Article

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