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Volumn 74, Issue 3 I, 2003, Pages 1211-1216

A microscope for imaging, spectroscopy, and lithography at the nanometer scale: Combination of a two-photon laser scanning microscope and an atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE COUPLED DEVICES; CRYSTAL STRUCTURE; GALLIUM NITRIDE; LIGHT SCATTERING; MOLECULAR BEAM EPITAXY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; NEODYMIUM LASERS; OPTICAL RESOLVING POWER; PHOTOLITHOGRAPHY; PHOTOLUMINESCENCE; PHOTOMULTIPLIERS; PULSED LASER APPLICATIONS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING POLYMERS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037348288     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1535234     Document Type: Article
Times cited : (5)

References (22)
  • 12
    • 0012629942 scopus 로고    scopus 로고
    • note
    • Scan range can be as large as 140 μm×140 μm before it becomes unstable due to vibration.
  • 13
    • 0012681309 scopus 로고    scopus 로고
    • note
    • CCD camera can be mounted on the eyepiece for this purpose to avoid direct viewing of any laser light.
  • 20
    • 0012738850 scopus 로고    scopus 로고
    • note
    • Use as received from Microchem Corp., Newton, MA 02464.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.