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Volumn 51, Issue 10, 1997, Pages 760-767

Optical Microscopy in the Nano-World

(33)  Pohl, Dieter W a   Bach, Hermann b   Bopp, Martin A c   Deckert, Volker b   Descouts, Pierre d   Eckert, Rolf c   Güntherodt, Hans Joachim c   Hafner, Christian b   Hecht, Bert b   Heinzelmann, Harry c   Huser, Thomas c   Jobin, Mark d,e   Keller, Ursula b   Lacoste, Thilo c   Lambelet, Patrick f   Marquis Weible, Fabienne f   Martin, Olivier J F b   Meixner, Alfred J c   Nechay, Bettina b   Novotny, Lukas b   more..


Author keywords

[No Author keywords available]

Indexed keywords


EID: 0346422501     PISSN: 00094293     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (38)
  • 3
    • 0022318102 scopus 로고
    • Micron and Submicron Integrated Circuit Metrology
    • Ed. K.M. Monahan
    • D.W. Pohl, W. Denk, U. Dürig, in 'Micron and Submicron Integrated Circuit Metrology', Ed. K.M. Monahan, Proc. SPIE 1985, 565, 56.
    • (1985) Proc. SPIE , vol.565 , pp. 56
    • Pohl, D.W.1    Denk, W.2    Dürig, U.3
  • 7
    • 0003348548 scopus 로고
    • 'Near Field Optics', Eds. D.W. Pohl, and D. Courjon, Kluwer, Dordrecht
    • E. Betzig, in 'Near Field Optics', Eds. D.W. Pohl, and D. Courjon, Kluwer, Dordrecht, 1993, NATO ASI Series E: Applied Sciences, Vol. 242. pp. 7-15.
    • (1993) NATO ASI Series E: Applied Sciences , vol.242 , pp. 7-15
    • Betzig, E.1
  • 19
    • 0011823513 scopus 로고
    • Scanning Microscopy Technologies and Applications
    • Ed. E.C. Teague
    • D.W. Pohl, U.C. Fischer, U.T. Dürig, in 'Scanning Microscopy Technologies and Applications', Ed. E.C. Teague, Proc. SPIE 1988, 897, 84.
    • (1988) Proc. SPIE , vol.897 , pp. 84
    • Pohl, D.W.1    Fischer, U.C.2    Dürig, U.T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.