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Volumn 31, Issue 9, 2003, Pages 1127-1130

Application of scanning probe microscopy in nanofabrication

(3) Sun, Xuping a Zhang, Bailin a Wang, Erkang a

a CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY (China)

Author keywords

Application; Nanofabrication; Review; Scanning probe microscopy

Indexed keywords

ATOM; MOLECULE; NANOPARTICLE; REVIEW; SCANNING PROBE MICROSCOPY; TOPOGRAPHY;

EID: 0346256674 PISSN: 02533820 EISSN: None Source Type: Journal
DOI: None Document Type: Review

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.