Application of scanning near-field optical microscopy to thin organic film devices

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 269-274

  Fujihira, M ^a   Monobe, H ^a   Koike, A ^a   Ivanov, G R ^a   Muramatsu, H ^b   Chiba, N ^b   Yamamoto, N ^b   Ataka, T ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SEIKO INSTRUMENTS INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETCHING; LANGMUIR BLODGETT FILMS; OPTICAL FIBERS; OPTICAL MICROSCOPY; THIN FILM DEVICES;

FLUORESCENCE MICROSCOPY; FLUORESCENCE SPECTROSCOPY; FRICTION FORCE MICROSCOPY; OPTICAL FIBER PROBE; SCANNING NEAR FIELD OPTICAL MICROSCOPE; THIN ORGANIC FILM DEVICES;

MICROSCOPIC EXAMINATION;

AMMONIUM DERIVATIVE; ARACHIDONIC ACID; CATION; POLYMER; POLYVINYL DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; FLUORESCENCE SPECTROSCOPY; MICROSCOPY; OPTICS; POLYMERIZATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0032033814     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00105-8     Document Type: Article

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