Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe: Image interpretation and resolution for high topographic variations

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 361-370

  Barchiesi, Dominique ^a   Bergossi, Olivier ^b   Pieralli, Christian ^a   Spajer, Michel ^a  

^a FEMTO ST INSTITUTE   (France)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

Image processing; Microscopy; Near field; Resolution

Indexed keywords

IMAGE PROCESSING; LIGHTING; MICROSCOPES; OPTICAL PROPERTIES; PROBES;

CONSTANT HEIGHT IMAGING MODE; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

ARTICLE; IMAGE PROCESSING; MATHEMATICAL MODEL; MICROSCOPY; OPTICS; SCANNING NEAR FIELD OPTICAL MICROSCOPY; THEORY;

EID: 0032033561     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00068-5     Document Type: Article

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