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Volumn 42, Issue 7 B, 2003, Pages 4825-4829

Nanolithography using the scanning tunneling microscope

Author keywords

Field evaporation; Nanolithography; Nanoparticles; Nanopatterning; Nanostructures; Semiconductors; Silicon; STM

Indexed keywords

ATOMS; ELECTRIC FIELDS; HYDROGENATION; OXYGEN; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SINGLE CRYSTALS;

EID: 0141792478     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.4825     Document Type: Article
Times cited : (19)

References (68)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.