The use of a near-field probe for the study of semiconductor heterostructures

Semiconductor Science and Technology

Volumn 13, Issue 8, 1998, Pages 882-886

  Stevenson, R ^a   Richards, D ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001647765     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/13/8/009     Document Type: Article

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