Theory of resonant SNOM (scanning near-field optical microscopy): Breakdown of the electric dipole selection rule in the reflection mode

Surface Science

Volumn 363, Issue 1-3, 1996, Pages 378-384

  Cho, Kikuo ^a   Ohfuti, Yasushi ^a   Arima, Kiyoshi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Dipole selection rule; Scanning near field optical microscopy

Indexed keywords

CALCULATIONS; COHERENT LIGHT; ELECTRIC BREAKDOWN; ELECTROMAGNETIC FIELDS; LIGHTING; MAXWELL EQUATIONS; POLARIZATION; PROBES; REFLECTION; RESONANCE; SCANNING; SPURIOUS SIGNAL NOISE;

COHERENCE OF MATTER STATE; DIPOLE SELECTION RULE; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCHRODINGER EQUATION;

OPTICAL MICROSCOPY;

EID: 0030206343     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00164-1     Document Type: Article

References (8)

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2. K. Cho, Prog. Theor. Phys. Suppl. 106 (1991) 225; K. Cho, H. Ishihara and Y. Ohfuti, J. Luminescence 58 (1994) 95.
3. Y. Ohfuti and K. Cho, Phys. Rev. B 52 (1995) 4828.
4. Y. Ohfuti and K. Cho, Proc. Int. Conf. DPC'95, to be published in J. Luminescence.
5. C. Girard and D. Courjon, Phys. Rev. B 42 (1990) 9340.
6. O. Keller, M. Xiao and S. Bozhevolnyi, Surf. Sci. 280 (1993) 217.
7. Y. Ohfuti and K. Cho: Phys. Rev. B 51 (1995) 14 376.
8. K. Cho, Y. Ohfuti and K. Arima, Jpn. J. Appl. Phys. 34 (1995) suppl. 34-1, p, 267.