Nano-optical image and probe in a scanning near-field optical microscope

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 388-393

  Hosaka, Sumio ^a   Shintani, Toshimichi ^a   Kikukawa, Atsushi ^a   Itoh, Kenchi ^a  

^a HITACHI LTD   (Japan)

Author keywords

06.90.+V; 42.30.V; 42.30.Yc; MTF; Nanometer size; Near field; Non contact; NSOM; SB15; SNOM; SPM

Indexed keywords

EID: 0013447690     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00560-1     Document Type: Article

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