SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 99-105

Monolithic gallium arsenide cantilever for scanning near-field microscopy

(6) Heisig, S a Danzebrink, H U b Leyk, A c Mertin, W c Munster S a Oesterschulze, E a

a UNIVERSITY OF KASSEL (Germany)

b PHYSIKALISCH TECHNISCHE BUNDESANSTALT (Germany)

c UNIVERSITY OF DUISBURG ESSEN (Germany)

Author keywords

Atomic force microscopy; Microwave technology; Near field scanning optical microscopy; Scanning probe microscopes

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; ETCHING; MECHANICAL PROPERTIES; MICROWAVES; OPTICAL MICROSCOPY; PHYSICAL PROPERTIES; SCHOTTKY BARRIER DIODES; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; TECHNOLOGY;

HIGH FREQUENCY SCANNING ELECTRON FORCE MICROSCOPY; MICROWAVE TECHNOLOGY; MONOLITHIC CANTILEVER; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SCANNING PROBE MICROSCOPE;

OPTICAL FIBERS;

GALLIUM ARSENIDE; SILICON;

ARTICLE; DIELECTRIC CONSTANT; SCANNING ELECTRON MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SEMICONDUCTOR; SENSOR;

EID: 0032033799 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(97)00118-6 Document Type: Article

Times cited : (29)

References (10)

1
- 0345692504
- Sensors for scanning probe microscopy
- Portugal, Lissabon
- R. Kassing, E. Oesterschulze, Sensors for scanning probe microscopy, Nato Workshop, Portugal, Lissabon, 1996; NATO ASI Series, Kluwer Academic Publishers, Dordrecht, to be published.
- (1996) Nato Workshop
- Kassing, R.¹ Oesterschulze, E.²

2
- 0003652233
- Kluwer Academic Publishers, Dordrecht, to be published
- R. Kassing, E. Oesterschulze, Sensors for scanning probe microscopy, Nato Workshop, Portugal, Lissabon, 1996; NATO ASI Series, Kluwer Academic Publishers, Dordrecht, to be published.
- NATO ASI Series

3
- 0029310091
- Davis R.C., Williams C.C., Neuzil P. Appl. Phys. Lett. 66:1995;2309.
- (1995) Appl. Phys. Lett. , vol.66 , pp. 2309
- Davis, R.C.¹ Williams, C.C.² Neuzil, P.³

4
- 0003469907
- D.W. Pohl, & D. Courjon. Dordrecht: Kluwer
- Danzebrink H.U., Fischer U.C. Pohl D.W., Courjon D. Near Field Optics. 1993;303 Kluwer, Dordrecht.
- (1993) Near Field Optics , pp. 303
- Danzebrink, H.U.¹ Fischer, U.C.²

5
- 0029734819
- Akamine S., Kuwano H., Yamada H. Appl. Phys. Lett. 68:1994;579.
- (1994) Appl. Phys. Lett. , vol.68 , pp. 579
- Akamine, S.¹ Kuwano, H.² Yamada, H.³

6
- 26144480895
- C. Böhm, M. Otterbeck, S. Lipp, L. Frey, R. Reuter, A. Leyk, W. Mertin, F.J. Tegude, E. Kubalek, IEEE Trans. Microwave Theory Tech.-s (1996) 1529.
- (1996) IEEE Trans. Microwave Theory Tech.-s , pp. 1529
- Böhm, C.¹ Otterbeck, M.² Lipp, S.³ Frey, L.⁴ Reuter, R.⁵ Leyk, A.⁶ Mertin, W.⁷ Tegude, F.J.⁸ Kubalek, E.⁹

7
- 0003625021
- New York: Wiley
- Howes M.J., Morgan D.V. Gallium Arsenide - Materials, Devices, and Circuits. 1986;Wiley, New York.
- (1986) Gallium Arsenide - Materials, Devices, and Circuits
- Howes, M.J.¹ Morgan, D.V.²

8
- 0019554558
- Shaw D.W. J. Electrochem. Soc. 128:1981;874.
- (1981) J. Electrochem. Soc. , vol.128 , pp. 874
- Shaw, D.W.¹

9
- 0012579468
- M. Stopka, S. Münster, T. Leinhos, Ch. Mihalcea, W. Scholz, A. Leyk, W. Mertin, E. Oesterschulze, SPIE Proc. Vol. 3009, 1997, pp. 92-100.
- (1997) SPIE Proc. , vol.3009 , pp. 92-100
- Stopka, M.¹ Münster, S.² Leinhos, T.³ Mihalcea, Ch.⁴ Scholz, W.⁵ Leyk, A.⁶ Mertin, W.⁷ Oesterschulze, E.⁸

10
- 0004005306
- New York: Wiley
- Sze S.M. Physics of Semiconductor Devices. 1981;Wiley, New York.
- (1981) Physics of Semiconductor Devices
- Sze, S.M.¹

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