3-stage variable length continuous-flow scan vector decompression scheme

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 79-86

  Krishna, C V ^a   Touba, Nur A ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST GENERATION PROCESS (ATGP); DECOMPRESSION; DECOMPRESSORS; SCAN VECTORS;

AUTOMATIC TESTING; COMPACTION; DATA COMPRESSION; DATA REDUCTION; DATA STORAGE EQUIPMENT; FEEDBACK; NETWORKS (CIRCUITS); SCANNING; SHIFT REGISTERS; SIGNAL ENCODING;

VECTORS;

EID: 3142689875     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2004.1299229     Document Type: Conference Paper

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