Design of phase shifters for BIST applications

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1998, Pages 218-224

  Rajski, J ^a   Tyszer, J ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; DESIGN FOR TESTABILITY; FLOWCHARTING; INTEGRATED CIRCUIT TESTING; PHASE CONTROL;

TEST GENERATORS;

PHASE SHIFTERS;

EID: 0032316342     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)