Test data compression using dictionaries with fixed-length indices [SOC testing]

Proceedings of the IEEE VLSI Test Symposium

Volumn 2003-January, Issue , 2003, Pages 219-224

  Li, Lei ^a   Chakrabarty, K ^a  

^a Duke University   (United States)

Author keywords

Automatic testing; Benchmark testing; Built in self test; Circuit faults; Circuit testing; Dictionaries; Graph theory; Logic testing; System on a chip; Test data compression

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; AUTOMATIC TESTING; BUILT-IN SELF TEST; DATA REDUCTION; DESIGN FOR TESTABILITY; DIGITAL STORAGE; GLOSSARIES; GRAPH THEORY; INTEGRATED CIRCUIT TESTING; PROGRAMMABLE LOGIC CONTROLLERS; SYSTEM-ON-CHIP; VLSI CIRCUITS;

BENCHMARK TESTING; CIRCUIT FAULTS; CIRCUIT TESTING; LOGIC TESTING; SYSTEM ON A CHIP; TEST DATA COMPRESSION;

DATA COMPRESSION;

EID: 15844377436     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2003.1197654     Document Type: Conference Paper

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