Reducing test application time through test data mutation encoding

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 387-393

  Reda, Sherief ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARK CIRCUIT; COMPRESSION ALGORITHMS; CURRENT TEST; SCAN-BASED DESIGNS; SEARCH ALGORITHMS; TEST APPLICATION TIME; TEST DATA; TEST VECTORS;

BENCHMARKING; ENCODING (SYMBOLS); EXHIBITIONS;

ALGORITHMS;

EID: 84893782556     PISSN: 15301591     EISSN: None     Source Type: Journal    
DOI: 10.1109/DATE.2002.998303     Document Type: Article

References (10)

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