Test application time and volume compression through seed overlapping

Proceedings - Design Automation Conference

Volumn , Issue , 2003, Pages 732-737

  Rao, Wenjing ^a   Bayraktaroglu, Ismet ^b   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SUN MICROSYSTEMS   (United States)

Author keywords

Deterministic Test; Scan Chain Concealment; SOC Test; Test Compression; XOR Network

Indexed keywords

ALGORITHMS; INTEGRATED CIRCUIT TESTING; VECTORS;

SCAN CHAIN CONCEALMENT (SCC);

CIRCUIT THEORY;

EID: 0042564438     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775832.776020     Document Type: Conference Paper

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