Improving compression ratio, area overhead, and test application time for system-on-a-chip test data compression/decompression

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 604-611

  Gonciari, Paul Theo ^a   Al Hashimi, Bashir M ^a   Nicolici, Nicola ^b  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARK CIRCUIT; EXPERIMENTAL COMPARISON; PRE-PROCESSING STEP; SYSTEM-ON-A-CHIP TEST; SYSTEMS-ON-A-CHIP; TEST APPLICATION TIME; TEST DATA COMPRESSION; THREE PARAMETERS;

ALGORITHMS; COMPRESSION RATIO (MACHINERY); EXHIBITIONS;

INTEGRATED CIRCUIT TESTING;

EID: 84893771642     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998363     Document Type: Conference Paper

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