Two-dimensional test data decompressor for multiple scan designs

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 186-194

  Zacharia, N ^a   Rajski, J ^a   Tyszer, J ^a   Waicukauski, J A ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; COST EFFECTIVENESS; PARALLEL PROCESSING SYSTEMS;

AUTOMATIC TEST PATTERN GENERATOR; BUILT IN SELF TEST (BIST); DESIGN FOR TESTABILITY (DFT); MULTIPLE SCAN DESIGNS; TWO DIMENSIONAL TEST DATA DECOMPRESSOR;

INTEGRATED CIRCUIT TESTING;

EID: 0030413788     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)