New dimension in nano-imaging: Breaking through the diffraction limit with scanning near-field optical microscopy

Analytical and Bioanalytical Chemistry

Volumn 381, Issue 1, 2005, Pages 165-172

  Rasmussen, Akiko ^a   Deckert, Volker ^a  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

Author keywords

Atomic force microscopy (AFM); Confocal imaging; Fluorescence; Raman; Scanning near field optical microscopy (SNOM)

Indexed keywords

BIOLOGY; MATERIALS SCIENCE; OPTICAL MICROSCOPY; SCATTERING;

ANALYTICAL TECHNIQUES; RESOLUTION; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);

IMAGING TECHNIQUES;

ACCURACY; DIFFRACTION; FLUORESCENCE; INFRARED SPECTROSCOPY; LIGHT SCATTERING; MICROSCOPY; MOLECULAR PHYSICS; REPRODUCIBILITY; REVIEW; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCANNING PROBE MICROSCOPY; THEORETICAL STUDY;

MICROSCOPY; NANOTECHNOLOGY; SPECTRUM ANALYSIS;

EID: 13844254569     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-004-2896-3     Document Type: Review

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