-
2
-
-
34848919386
-
-
G. Binnig, H. Rohrer, C. Gerber, E. Weibel, Phys. Rev. Lett. 1982, 49, 57-59.
-
(1982)
Phys. Rev. Lett.
, vol.49
, pp. 57-59
-
-
Binnig, G.1
Rohrer, H.2
Gerber, C.3
Weibel, E.4
-
3
-
-
0022453044
-
-
G. Binnig, H. Fuchs, C. Gerber, H. Rohrer, E. Stoll, E. Tosatti, Europhys. Lett. 1986, 1, 31-36.
-
(1986)
Europhys. Lett.
, vol.1
, pp. 31-36
-
-
Binnig, G.1
Fuchs, H.2
Gerber, C.3
Rohrer, H.4
Stoll, E.5
Tosatti, E.6
-
4
-
-
0010731014
-
-
R. Pool, Science 1990, 247, 634 -636.
-
(1990)
Science
, vol.247
, pp. 634-636
-
-
Pool, R.1
-
5
-
-
0021410769
-
-
D. W. Pohl, W. Denk, M. Lanz, Appl. Phys. Lett. 1984, 44, 651-653.
-
(1984)
Appl. Phys. Lett.
, vol.44
, pp. 651-653
-
-
Pohl, D.W.1
Denk, W.2
Lanz, M.3
-
6
-
-
0021287941
-
-
A. Lewis, M. Isaacson, A. Harootunian, A. Muray, Ultramicroscopy 1984, 13, 227-231.
-
(1984)
Ultramicroscopy
, vol.13
, pp. 227-231
-
-
Lewis, A.1
Isaacson, M.2
Harootunian, A.3
Muray, A.4
-
7
-
-
0011823513
-
-
Washington, DC
-
D.W. Pohl, U.C. Fischer, U. T. Durig, Scanning Microscopy Technologies and Applications, Washington, DC, 1988, pp. 84-90.
-
(1988)
Scanning Microscopy Technologies and Applications
, pp. 84-90
-
-
Pohl, D.W.1
Fischer, U.C.2
Durig, U.T.3
-
8
-
-
84958486703
-
-
H. Betzig, M. Isaacson, A. Lewis, K. Lin, Scanning Microsc. Technol. Appl. 1988, 897, 91-99.
-
(1988)
Scanning Microsc. Technol. Appl.
, vol.897
, pp. 91-99
-
-
Betzig, H.1
Isaacson, M.2
Lewis, A.3
Lin, K.4
-
10
-
-
0003877658
-
-
WILEY-VCH, Weinheim
-
D. Brune, R. Hellborg, H. J. Whitlow, O. Hunderi, Surface Characterization, WILEY-VCH, Weinheim, 1997.
-
(1997)
Surface Characterization
-
-
Brune, D.1
Hellborg, R.2
Whitlow, H.J.3
Hunderi, O.4
-
11
-
-
21544443037
-
-
R. Toledo-Crow, P.C. Yang, Y. Chen, M. Vaez-Iravani, Appl. Phys. Lett. 1992, 60, 2957-2959.
-
(1992)
Appl. Phys. Lett.
, vol.60
, pp. 2957-2959
-
-
Toledo-Crow, R.1
Yang, P.C.2
Chen, Y.3
Vaez-Iravani, M.4
-
12
-
-
21544436741
-
-
E. Betzig, P. L. Finn, J. S. Weiner, Appl. Phys. Lett. 1992, 60, 2484-2486.
-
(1992)
Appl. Phys. Lett.
, vol.60
, pp. 2484-2486
-
-
Betzig, E.1
Finn, P.L.2
Weiner, J.S.3
-
13
-
-
0028513801
-
-
M. Garcia-Parajo, E. Cambril, Y. Chen, Appl. Phys. Lett. 1994, 65, 1498-1500.
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 1498-1500
-
-
Garcia-Parajo, M.1
Cambril, E.2
Chen, Y.3
-
15
-
-
0000752010
-
-
J. W. P. Hsu, M. Lee, B. S. Deaver, Rev. Sci. Instrum. 1995, 66, 3177-3181.
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 3177-3181
-
-
Hsu, J.W.P.1
Lee, M.2
Deaver, B.S.3
-
17
-
-
0030148898
-
-
J. Barenz, O. Hollricher, O. Marti, Rev. Sci. Instrum. 1996, 67, 1912-1916.
-
(1996)
Rev. Sci. Instrum.
, vol.67
, pp. 1912-1916
-
-
Barenz, J.1
Hollricher, O.2
Marti, O.3
-
20
-
-
4143135577
-
-
B. Hecht, H. Bielefeldt, Y. Inouye, D. W. Pohl, L. Novotny, J. Appl. Phys. 1997, 81, 2492-2498.
-
(1997)
J. Appl. Phys.
, vol.81
, pp. 2492-2498
-
-
Hecht, B.1
Bielefeldt, H.2
Inouye, Y.3
Pohl, D.W.4
Novotny, L.5
-
22
-
-
0000301809
-
-
N. Kuck, K. Lieberman, A. Lewis, Appl. Phys. Lett. 1992, 61, 139-141.
-
(1992)
Appl. Phys. Lett.
, vol.61
, pp. 139-141
-
-
Kuck, N.1
Lieberman, K.2
Lewis, A.3
-
23
-
-
0028515488
-
-
F. Zenhausern, M. P. O'Boyle, H. K. Wickramasinghe, Appl. Phys. Lett. 1994, 65, 1623-1625.
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 1623-1625
-
-
Zenhausern, F.1
O'Boyle, M.P.2
Wickramasinghe, H.K.3
-
24
-
-
1542396457
-
-
F. Zenhausern, Y. Martin, H. K. Wickramasinghe, Science 1994, 269, 1083-1085.
-
(1994)
Science
, vol.269
, pp. 1083-1085
-
-
Zenhausern, F.1
Martin, Y.2
Wickramasinghe, H.K.3
-
25
-
-
0001040403
-
-
A. Lahrech, R. Bachelot, P. Gleyzes, A.C. Boccara, Opt. Lett. 1996, 21, 1315-1317.
-
(1996)
Opt. Lett.
, vol.21
, pp. 1315-1317
-
-
Lahrech, A.1
Bachelot, R.2
Gleyzes, P.3
Boccara, A.C.4
-
26
-
-
0031552789
-
-
A. Lahrech, R. Bachelot, P. Gleyzes, A. C. Boccara, Appl. Phys. Lett. 1997, 71, 575-577.
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 575-577
-
-
Lahrech, A.1
Bachelot, R.2
Gleyzes, P.3
Boccara, A.C.4
-
27
-
-
0001536175
-
-
E. J. Sánchez, L. Novotny, X. S. Xie, Phys. Rev. Lett. 1999, 82, 4014-4017.
-
(1999)
Phys. Rev. Lett.
, vol.82
, pp. 4014-4017
-
-
Sánchez, E.J.1
Novotny, L.2
Xie, X.S.3
-
29
-
-
12044259475
-
-
E. Betzig, J. K. Trautman, T. D. Harris, J. S, Weiner, R. L. Kostelak, Science 1991, 251, 1468-1470.
-
(1991)
Science
, vol.251
, pp. 1468-1470
-
-
Betzig, E.1
Trautman, J.K.2
Harris, T.D.3
Weiner, J.S.4
Kostelak, R.L.5
-
30
-
-
0029267575
-
-
G. A. Valaskovic, M. Holton, G. H. Morrison, Appl. Opt. 1995, 34, 1215-1228.
-
(1995)
Appl. Opt.
, vol.34
, pp. 1215-1228
-
-
Valaskovic, G.A.1
Holton, M.2
Morrison, G.H.3
-
31
-
-
0028607173
-
-
Oxford
-
U. C. Fischer, J. Koglin, H. Fuchs, J. Microsc. (Oxford) 1994, 176, 231-237.
-
(1994)
J. Microsc.
, vol.176
, pp. 231-237
-
-
Fischer, U.C.1
Koglin, J.2
Fuchs, H.3
-
32
-
-
0039616757
-
-
J. Koglin, U. C. Fischer, H. Fuchs, J. Biomed. Opt. 1996, 1, 75-78.
-
(1996)
J. Biomed. Opt.
, vol.1
, pp. 75-78
-
-
Koglin, J.1
Fischer, U.C.2
Fuchs, H.3
-
33
-
-
0000055999
-
-
J. A. Veerman, A. M. Otters, L. Kuipers, N. F. van Hulst, Appl. Phys. Lett. 1998, 72, 3115-3118.
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 3115-3118
-
-
Veerman, J.A.1
Otters, A.M.2
Kuipers, L.3
Van Hulst, N.F.4
-
34
-
-
0000795688
-
-
S. Pilevar, K. Edinger, W. Atia, I. Smolyaninov, C. Davis, Appl. Phys. Lett. 1998, 72, 3133-3135.
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 3133-3135
-
-
Pilevar, S.1
Edinger, K.2
Atia, W.3
Smolyaninov, I.4
Davis, C.5
-
35
-
-
0030984752
-
-
S. Münster, S. Werner, C. Mihalcea, W. Scholz, E. Oesterschulze, J. Microsc. 1997, 186, 17-22.
-
(1997)
J. Microsc.
, vol.186
, pp. 17-22
-
-
Münster, S.1
Werner, S.2
Mihalcea, C.3
Scholz, W.4
Oesterschulze, E.5
-
36
-
-
0001730287
-
-
W. Noell, M. Abraham, K. Mayr, A. Ruf, J. Barentz, O. Hollricher, O. Marti, P. Günther, Appl. Phys. Lett. 1997, 70, 1236-1238.
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 1236-1238
-
-
Noell, W.1
Abraham, M.2
Mayr, K.3
Ruf, A.4
Barentz, J.5
Hollricher, O.6
Marti, O.7
Günther, P.8
-
37
-
-
0032302213
-
-
Santa Clara, CA
-
D. Drews, W. Noell, W. Ehrfeld, M. Lacher, K. Mayr, O. Marti, C. Serwatzy, M. Abraham, SPIE Conference on Materials and Device Characterization in Micromachining, Santa Clara, CA, 1998, pp. 76-83.
-
(1998)
SPIE Conference on Materials and Device Characterization in Micromachining
, pp. 76-83
-
-
Drews, D.1
Noell, W.2
Ehrfeld, W.3
Lacher, M.4
Mayr, K.5
Marti, O.6
Serwatzy, C.7
Abraham, M.8
-
38
-
-
0032511648
-
-
T. Yatsuia, M. Kourogi, M. Ohtsu, Appl. Phys. Lett. 1998, 73, 2090-2092.
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 2090-2092
-
-
Yatsuia, T.1
Kourogi, M.2
Ohtsu, M.3
-
40
-
-
84975574711
-
-
L. Novotny, D. W. Pohl, B. Hecht, Opt. Lett. 1995, 20, 970-972.
-
(1995)
Opt. Lett.
, vol.20
, pp. 970-972
-
-
Novotny, L.1
Pohl, D.W.2
Hecht, B.3
-
41
-
-
0030128552
-
-
D. Zeisel, S. Nettesheim, B. Dutoit, R. Zenobi. Appl. Phys. Lett. 1996, 68, 2491-2492.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2491-2492
-
-
Zeisel, D.1
Nettesheim, S.2
Dutoit, B.3
Zenobi, R.4
-
42
-
-
0031260801
-
-
M. N. Islam, X. K. Zhao, A. A. Said, S. S. Mickel, C. F. Vail, Appl. Phys. Lett. 1997, 71, 2886-2888.
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 2886-2888
-
-
Islam, M.N.1
Zhao, X.K.2
Said, A.A.3
Mickel, S.S.4
Vail, C.F.5
-
43
-
-
0038161400
-
-
R. Stöckle, V. Deckert, C. Fokas, R. Zenobi, B. Hecht, B. Sick, U. P. Wild, Appl. Phys. Lett. 1999, 75, 160-162.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 160-162
-
-
Stöckle, R.1
Deckert, V.2
Fokas, C.3
Zenobi, R.4
Hecht, B.5
Sick, B.6
Wild, U.P.7
-
45
-
-
0028269587
-
-
J. K. Trautman, J. J. Macklin, L. E. Brus, E. Beizig, Nature 1994, 369, 40-42.
-
(1994)
Nature
, vol.369
, pp. 40-42
-
-
Trautman, J.K.1
Macklin, J.J.2
Brus, L.E.3
Beizig, E.4
-
47
-
-
33751159033
-
-
R. C. Dunn, G. R. Holtom, L. Mets, X. S. Xie, J. Phys. Chem. 1994, 98, 3094-3098.
-
(1994)
J. Phys. Chem.
, vol.98
, pp. 3094-3098
-
-
Dunn, R.C.1
Holtom, G.R.2
Mets, L.3
Xie, X.S.4
-
49
-
-
0031549598
-
-
A. G. T. Ruiter, J. A. Veerman, M. F. Garcia-Parajo, N. F. van Hulst, J. Phys. Chem. A 1997, 101, 7318-7323.
-
(1997)
J. Phys. Chem. A
, vol.101
, pp. 7318-7323
-
-
Ruiter, A.G.T.1
Veerman, J.A.2
Garcia-Parajo, M.F.3
Van Hulst, N.F.4
-
50
-
-
0039616755
-
-
U. Ziegler, A. Vinckier, P. Kernen, D. Zeisel, J. Biber, G. Semenza, H. Murer, P. Groscurth, Mol. Biol. Cell 1998, 9, 600.
-
(1998)
Mol. Biol. Cell
, vol.9
, pp. 600
-
-
Ziegler, U.1
Vinckier, A.2
Kernen, P.3
Zeisel, D.4
Biber, J.5
Semenza, G.6
Murer, H.7
Groscurth, P.8
-
51
-
-
85077781699
-
-
M. K. Hong, S. Erramilli, P. Huie, G. James, A. Jeung, SPIE 1996, 2863, 54-63.
-
(1996)
SPIE
, vol.2863
, pp. 54-63
-
-
Hong, M.K.1
Erramilli, S.2
Huie, P.3
James, G.4
Jeung, A.5
-
52
-
-
0028763822
-
-
D. P. Tsai, A. Othonos, M. Moskavits, Appl. Phys. Lett. 1994, 64, 1768-1770.
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 1768-1770
-
-
Tsai, D.P.1
Othonos, A.2
Moskavits, M.3
-
53
-
-
21544433024
-
-
C. L. Jahncke, M. A. Paesler, H. D. Hallen, Appl. Phys. Lett. 1995, 67, 2483-2485.
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 2483-2485
-
-
Jahncke, C.L.1
Paesler, M.A.2
Hallen, H.D.3
-
54
-
-
0000226893
-
-
C. L. Jahncke, H. D. Hallen, M. A. Paesler, J. Raman Spectrosc. 1996, 27, 579-586.
-
(1996)
J. Raman Spectrosc.
, vol.27
, pp. 579-586
-
-
Jahncke, C.L.1
Hallen, H.D.2
Paesler, M.A.3
-
55
-
-
0029553714
-
-
D. A. Smith, S. Webster, M. Ayad, S. D. Evans, D. Fogherty, D. Batchelder, Ultramicroscopy 1995, 61, 247-252.
-
(1995)
Ultramicroscopy
, vol.61
, pp. 247-252
-
-
Smith, D.A.1
Webster, S.2
Ayad, M.3
Evans, S.D.4
Fogherty, D.5
Batchelder, D.6
-
57
-
-
0032157592
-
-
Y. Narita, T. Tadokoro, T. Ikeda, T. Sakai, S. Mononobe, M. Ohtsu, Appl. Spectrosc. 1998, 52, 1141-1144.
-
(1998)
Appl. Spectrosc.
, vol.52
, pp. 1141-1144
-
-
Narita, Y.1
Tadokoro, T.2
Ikeda, T.3
Sakai, T.4
Mononobe, S.5
Ohtsu, M.6
-
58
-
-
0003588462
-
-
S. J. Stranick, L. J. Richter, R. R. Cavanagh, J. Vac. Sci. Technol. B 1998, 16, 1948-1952.
-
(1998)
J. Vac. Sci. Technol. B
, vol.16
, pp. 1948-1952
-
-
Stranick, S.J.1
Richter, L.J.2
Cavanagh, R.R.3
-
59
-
-
0001703456
-
-
D. Zeisel, B. Dutoit, V. Deckert, T. Roth, R. Zenobi, Anal. Chem. 1997, 69, 749-754.
-
(1997)
Anal. Chem.
, vol.69
, pp. 749-754
-
-
Zeisel, D.1
Dutoit, B.2
Deckert, V.3
Roth, T.4
Zenobi, R.5
-
60
-
-
0032512492
-
-
D. Zeisel, V. Deckert, R. Zenohi, T. Vo-Dinh, Chem. Phys. Lett. 1998, 283, 381-385.
-
(1998)
Chem. Phys. Lett.
, vol.283
, pp. 381-385
-
-
Zeisel, D.1
Deckert, V.2
Zenohi, R.3
Vo-Dinh, T.4
-
62
-
-
0001010544
-
-
V. Deckert, D. Zeisel, R. Zenohi, T. Vo-Dinh, Anal. Chem. 1998, 70, 2646-2650.
-
(1998)
Anal. Chem.
, vol.70
, pp. 2646-2650
-
-
Deckert, V.1
Zeisel, D.2
Zenohi, R.3
Vo-Dinh, T.4
-
63
-
-
0002198462
-
-
R. Stöckle, V. Deckert, C. Fokas, D. Zeisel, R. Zenohi, Vibr. Spectrosc. 2000, 22, 39-48.
-
(2000)
Vibr. Spectrosc.
, vol.22
, pp. 39-48
-
-
Stöckle, R.1
Deckert, V.2
Fokas, C.3
Zeisel, D.4
Zenohi, R.5
-
65
-
-
0001272870
-
-
K. Kneipp, Y. Wang, H. Kneipp, I. Itzkan, R. R. Dasari, M. S. Feld, Phys. Rev. Lett. 1996, 76, 2444-2446.
-
(1996)
Phys. Rev. Lett.
, vol.76
, pp. 2444-2446
-
-
Kneipp, K.1
Wang, Y.2
Kneipp, H.3
Itzkan, I.4
Dasari, R.R.5
Feld, M.S.6
-
67
-
-
0032033787
-
-
D. Kossakovski, S. D. O'Connor, M. Widmer, J. D. Baldeshwieler, J. L. Beauchamp, Ultramicroscopy 1998, 71, 111-115.
-
(1998)
Ultramicroscopy
, vol.71
, pp. 111-115
-
-
Kossakovski, D.1
O'Connor, S.D.2
Widmer, M.3
Baldeshwieler, J.D.4
Beauchamp, J.L.5
-
68
-
-
0040208492
-
-
Tucson, Arizona
-
J. D. Hogan, D. A. Laude, The 38th ASMS Conference on Mass Spectrometry and Allied Topics, Tucson, Arizona, 1990, pp. 848-849.
-
(1990)
The 38th ASMS Conference on Mass Spectrometry and Allied Topics
, pp. 848-849
-
-
Hogan, J.D.1
Laude, D.A.2
-
69
-
-
0001402709
-
-
K. Dreisewerd, M. Schürenberg, M. Karas, F. Hillenkamp, Int. J. Mass Spectrum. Ion Processes 1995, 141, 127-148.
-
(1995)
Int. J. Mass Spectrum. Ion Processes
, vol.141
, pp. 127-148
-
-
Dreisewerd, K.1
Schürenberg, M.2
Karas, M.3
Hillenkamp, F.4
-
70
-
-
0031207377
-
-
B. Dutoit, D. Zeisel, V. Deckert, R. Zenobi, J. Phys. Chem. B 1997, 101, 6955-6959.
-
(1997)
J. Phys. Chem. B
, vol.101
, pp. 6955-6959
-
-
Dutoit, B.1
Zeisel, D.2
Deckert, V.3
Zenobi, R.4
-
71
-
-
0030572088
-
-
M. Stähelin, M. A. Bopp, G. Tarrach, A. J. Meixner, I. Zschokke-Gränacher, Appl. Phys. Lett. 1996, 68, 2603-2605.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2603-2605
-
-
Stähelin, M.1
Bopp, M.A.2
Tarrach, G.3
Meixner, A.J.4
Zschokke-Gränacher, I.5
-
73
-
-
0030191529
-
-
C. Lienau, A. Richter, T. Elsaesser, Appl. Phys. Lett. 1996, 69, 325-327.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 325-327
-
-
Lienau, C.1
Richter, A.2
Elsaesser, T.3
-
74
-
-
0040802868
-
-
D. Singleton, G. Paraskevopoulos, R. S. Taylor, Chem. Phys. 1990, 144, 415-423.
-
(1990)
Chem. Phys.
, vol.144
, pp. 415-423
-
-
Singleton, D.1
Paraskevopoulos, G.2
Taylor, R.S.3
-
75
-
-
0033064717
-
-
R. Stöckle, N. Schaller, V. Deckert, C. Fokas, R. Zenobi, J. Microsc. 1999, 194, 378-382.
-
(1999)
J. Microsc.
, vol.194
, pp. 378-382
-
-
Stöckle, R.1
Schaller, N.2
Deckert, V.3
Fokas, C.4
Zenobi, R.5
-
77
-
-
0000274050
-
-
R. Stöckle, Y.-D. Suh, V. Deckert, R. Zenobi, Chem. Phys. Lett. 2000, 318, 131-136.
-
(2000)
Chem. Phys. Lett.
, vol.318
, pp. 131-136
-
-
Stöckle, R.1
Suh, Y.-D.2
Deckert, V.3
Zenobi, R.4
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