Focal spots of size λ/23 open up far-field florescence microscopy at 33 nm axial resolution

Physical Review Letters

Volumn 88, Issue 16, 2002, Pages 1639011-1639014

  Van Nguyen, X ^a   Stebe, Kathleen J ^a  

^a Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; DIFFRACTION; ELECTROMAGNETIC WAVES; FLUORESCENCE; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER;

FAR-FIELD FLUORESCENCE MICROSCOPY;

DIFFRACTIVE OPTICS;

EID: 34547999288     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)