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Volumn 94, Issue 3-4, 2003, Pages 237-244
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Apertureless near-field scanning Raman microscopy using reflection scattering geometry
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Author keywords
Near field; Raman imaging; Simulation; Spectroscopy
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Indexed keywords
LIGHT REFLECTION;
LIGHT SCATTERING;
RAMAN SPECTROSCOPY;
SEMICONDUCTOR QUANTUM DOTS;
NANODEVICES;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
METAL;
SILICON;
SILVER;
ANALYTIC METHOD;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL STRUCTURE;
DEVICE;
GEOMETRY;
IMAGE ENHANCEMENT;
LIGHT SCATTERING;
MATERIAL COATING;
RAMAN SPECTROMETRY;
SCANNING NEAR FIELD OPTICAL MICROSCOPY;
STRUCTURE ANALYSIS;
TIME;
TRANSMISSION ELECTRON MICROSCOPY;
ALGORITHMS;
COMPUTER SIMULATION;
ELECTRIC CAPACITANCE;
ELECTRIC IMPEDANCE;
EQUIPMENT DESIGN;
MICROSCOPY, SCANNING PROBE;
SCATTERING, RADIATION;
SILVER;
SPECTRUM ANALYSIS, RAMAN;
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EID: 0037375702
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(02)00334-0 Document Type: Article |
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Times cited : (62)
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References (9)
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