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Volumn 202, Issue 1, 2001, Pages 94-99
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Apertureless near-field optical microscopy via local second-harmonic generation
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Author keywords
Apertureless SNOM; Electromagnetic field enhancement; Scanning near field microscopy
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Indexed keywords
ELECTROMAGNETIC FIELDS;
HARMONIC ANALYSIS;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
NONLINEAR OPTICS;
OPTICAL PROPERTIES;
PROBES;
APERTURELESS SCANNING;
APERTURELESS SCANNING NEAR-FIELD OPTICAL MICROSCOPE;
ELECTROMAGNETIC FIELD ENHANCEMENT;
ELECTROMAGNETIC INTERACTIONS;
IMAGING MECHANISM;
NEAR FIELD OPTICAL MICROSCOPY;
PROBE TIPS;
SCANNING NEAR FIELD MICROSCOPY;
SCANNING NEAR-FIELD OPTICAL MICROSCOPE;
SECOND HARMONICS;
HARMONIC GENERATION;
CONFERENCE PAPER;
ELECTROMAGNETIC FIELD;
IMAGE ENHANCEMENT;
MICROSCOPE IMAGE;
POLARIZATION;
PRIORITY JOURNAL;
SCANNING NEAR FIELD OPTICAL MICROSCOPY;
SURFACE PROPERTY;
TECHNIQUE;
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EID: 0035060164
PISSN: 00222720
EISSN: None
Source Type: Journal
DOI: 10.1046/j.1365-2818.2001.00810.x Document Type: Conference Paper |
Times cited : (42)
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References (23)
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