The fourier transform used as a tool to evaluate systems for digitizing electron images

Microscopy Microanalysis Microstructures

Volumn 8, Issue 1, 1997, Pages 11-19

  Bron, Patrick ^a   Rolland, Jean Paul ^a   Thomas, Daniel ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007140153     PISSN: 11542799     EISSN: None     Source Type: Journal    
DOI: 10.1051/mmm:1997102     Document Type: Article

References (10)

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3. Frank J., Shimkin B. and Dowse H., Ultramicroscopy G (1981) 343-358.
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5. Crowther R.A., Henderson R. and Smith J.M., J. Struct. Dial 116 (1996) 9-16.
6. Wrigley N.G., J. Ultrastructure Res. 24 (1968) 454-464.
7. McGee P.A., Trus B.L. and Steven A.C., Micron 13 (1982) 221-228.
8. De Ruijter W.J., Micron 26 (1995) 247-275.
9. Ishizuka K., Ultramicroscopy 52 (1992) 7-20.
10. Brink J. and Chiu W., J. Struct. Biol. 113 (1994) 23-34.